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Ahmadi, Mohammad and Soltani-Nabipour, Jamshid and Khorshidi, Abdollah Electrical duality design for the radon-222 decay chain. Microelectronics Reliability.
Banihashemi, Navid and Soltani-Nabipour, Jamshid and Khorshidi, Abdollah Quality control assessment of Philips digital radiography and comparison with Spellman and Samsung systems in Tehran Oil Ministry Hospital. Eur. Phys. J. Plus.
Khorshidi, Abdollah Assessment of SPECT images using UHRFB and other low-energy collimators in brain study by Hoffman phantom and manufactured defects. The European Physical Journal Plus.